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 DATA SHEET
MOS INTEGRATED CIRCUIT
PD3728
7300 PIXELS x 3 COLOR CCD LINEAR IMAGE SENSOR
The PD3728 is a high-speed and high sensitive color CCD (Charge Coupled Device) linear image sensor which changes optical images to electrical signal and has the function of color separation. The PD3728 has 3 rows of 7300 pixels, and it is a 2-output/color type CCD sensor with 2 rows/color of charge transfer register, which transfers the photo signal electrons of 7300 pixels separately in odd and even pixels. Therefore, it is suitable for 600 dpi/A3 high-speed color digital copiers and so on.
FEATURES
* Valid photocell * Line spacing * Color filter * Resolution * Data rate * Output type * Power supply * On-chip circuits : 7300 pixels x 3 : 40 m (4 lines) Red line-Green line, Green line-Blue line : Primary colors (red, green and blue), pigment filter (with light resistance 107 lx*hour) : 24 dot/mm (600 dpi) A3 (297 x 420 mm) size (shorter side) : 40 MHz MAX. (20 MHz/1 output) : 2 outputs in phase/color : +12 V : Reset feed-through level clamp circuits Voltage amplifiers
* Photocell's pitch : 10 m
* Drive clock level : CMOS output under 5 V operation
ORDERING INFORMATION
Part Number Package CCD linear image sensor 36-pin ceramic DIP (600 mil)
PD3728D
The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. S13878EJ1V0DS00(1st edition) Date published April 1999 N CP(K) Printed in Japan
(c)
1999
PD3728
BLOCK DIAGRAM
CLB
30
1L
29
20
28
GND 16
1
23
2
24
GND
31
VOUT2 (Blue, even)
32
CCD analog shift register Transfer gate
S7299 S7300
D128
D129
D27
GND
33
.....
S1 S2
Photocell (Blue)
.....
D134
22
TG1 (Blue)
VOUT1 (Blue, odd) GND
34 35
Transfer gate CCD analog shift register
VOUT3 36 (Green, odd)
CCD analog shift register Transfer gate
S7299 S7300
D128
D129
D27
S1 S2
.....
Photocell (Green)
.....
D134
21
TG2 (Green)
VOUT4 1 (Green, even) GND VOUT6 (Red, even) 2 3
Transfer gate CCD analog shift register
CCD analog shift register Transfer gate
S7299 S7300
D128
D129
D27
S1 S2
GND
4
.....
Photocell (Red)
.....
D134
15
TG3 (Red)
VOUT5 (Red, odd)
5
Transfer gate CCD analog shift register
GND
6
7 VOD
8
9
13
14
RB
10
1
2
2
DATA SHEET S13878EJ1V0DS00
PD3728
PIN CONFIGURATION (Top View) CCD linear image sensor 36-pin ceramic DIP (600 mil)
* PD3728D
Output signal 4 (Green, even) VOUT4 1 Ground GND 2
36 VOUT3 35 GND
Output signal 3 (Green, odd) Ground Output signal 1 (Blue, odd) Ground Output signal 2 (Blue, even) Ground Reset feed-through level clamp clock Last stage shift register clock 1 Shift register clock 20
1
1
Output signal 6 (Red, even) VOUT6 3 Ground GND 4
1 Blue
34 VOUT1 33 GND 32 VOUT2 31 GND 30 CLB 29 1L 28 20
Output signal 5 (Red, odd) VOUT5 5 Ground Output drain voltage Reset gate clock Shift register clock 10 GND 6 VOD 7
RB 8 10 9
Green
Red
No connection No connection No connection Shift register clock 1 Shift register clock 2
NC 10 NC 11 NC 12
27 NC 26 NC 25 NC 24 2 23 1 22 TG1
No connection No connection No connection Shift register clock 2 Shift register clock 1 Transfer gate clock 1 (for Blue) Transfer gate clock 2 (for Green) No connection No connection
1 13 2 14
Transfer gate clock 3 (for Red) TG3 15
7300
7300
7300
Ground No connection No connection
GND 16 NC 17 NC 18
21 TG2 20 NC 19 NC
PHOTOCELL STRUCTURE DIAGRAM
PHOTOCELL ARRAY STRUCTURE DIAGRAM (Line spacing)
10 m
7 m 3 m
Blue photocell array 4 lines (40 m)
10 m
Channel stopper
10 m
Green photocell array 4 lines (40 m)
10 m
Aluminum shield
Red photocell array
DATA SHEET S13878EJ1V0DS00
3
PD3728
ABSOLUTE MAXIMUM RATINGS (TA = +25 C)
Parameter Output drain voltage Shift register clock voltage Reset gate clock voltage Reset feed-through level clamp clock voltage Transfer gate clock voltage Operating ambient temperature Storage temperature VOD V1, V1L, V10, V2, V20 VRB VCLB VTG1 to VTG3 TA Tstg Symbol Ratings -0.3 to +15 -0.3 to +15 -0.3 to +15 -0.3 to +15 -0.3 to +15 -25 to +60 -40 to +100 Unit V V V V V C C
Caution Exposure to ABSOLUTE MAXIMUM RATINGS for extended periods may affect device reliability; exceeding the ratings could cause permanent damage. The parameters apply independently.
RECOMMENDED OPERATING CONDITIONS (TA = +25 C)
Parameter Output drain voltage Shift register clock high level Shift register clock low level Reset gate clock high level Reset gate clock low level Reset feed-through level clamp clock high level Reset feed-through level clamp clock low level Transfer gate clock high levelNote VOD V1H, V1LH, V10H, V2H, V20H V1L, V1LL, V10L, V2L, V20L VRBH VRBL VCLBH VCLBL VTG1H to VTG3H Symbol MIN. 11.4 4.5 -0.3 4.5 -0.3 4.5 -0.3 4.5 TYP. 12.0 5.0 0 5.0 0 5.0 0 V1H (V10H) 0 2 MAX. 12.6 5.5 +0.5 5.5 +0.5 5.5 +0.5 V1H (V10H) +0.5 40 Unit V V V V V V V V
Transfer gate clock low level Data rate
VTG1L to VTG3L 2fRB
-0.3 -
V MHz
Note
When Transfer gate clock high level (VTG1H to VTG3H) is higher than Shift register clock high level (V1H (V10H)), Image lag can increase.
Remark Pin 9 (10) and pin 28 (20) should be open to decrease the influence of input clock noise to output signal waveform, in case of operating at low or middle speed range; data rate under 24 MHz or so.
4
DATA SHEET S13878EJ1V0DS00
PD3728
ELECTRICAL CHARACTERISTICS
TA = +25 C, VOD = 12 V, fRB = 1 MHz, data rate = 2 MHz, storage time = 10 ms, light source: 3200 K halogen lamp +C-500S (infrared cut filter, t = 1mm), input signal clock = 5 Vp-p
Parameter Saturation voltage Saturation exposure Red Green Blue Photo response non-uniformity Average dark signal
Note 1
Symbol Vsat SER SEG SEB PRNU ADS1 ADS2
Test Conditions
MIN. 1.5
TYP. 2.0 0.35 0.39 0.31
MAX. -
Unit V lx*s lx*s lx*s
VOUT = 1 V Light shielding
6 1.0 0.5
18 5.0 5.0 5.0 5.0 800 0.5 7.3 6.6 8.3 5.0 5.0 6.0
% mV mV mV mV mW k V/lx*s V/lx*s V/lx*s % % V ns
Dark signal non-uniformity
Note 1
DSNU1 DSNU2
Light shielding
2.0 1.0 600 0.3 3.9 3.6 4.5 5.6 5.1 6.4 2.0 1.0 4.0 5.0 20 0 95 98
Power consumption Output impedance Response Red Green Blue Image lag
Note 1
PW ZO RR RG RB IL1 IL2 VOUT = 1 V
Offset level
Note 2 Note 3
VOS td RI TTE VOUT = 1 V VOUT = 1 V VOUT = 1 V, data rate = 40 MHz
Output fall delay time Register imbalance
4.0
% %
Total transfer efficiency
Response peak
Red Green Blue
630 540 460 DR11 DR12 DR21 DR22 Vsat/DSNU1 Vsat/DSNU2 Vsat/bit1 Vsat/bit2 Light shielding Light shielding, bit clamp mode (t7 = 150 ns) Light shielding, line clamp mode (t19 = 3 s) -500 - - - - 1000 2000 2000 4000 +200 1.0 0.5 4.0 2.0 +500 - - - -
nm nm nm times times times times mV mV mV mV mV
Dynamic range
Note 1
Reset feed-through noise Random noise
Note 1
Note 2
RFTN bit1 bit2 line1 line2
Notes 1. ADS1, DSNU1, IL1, DR11, DR21, bit1 and line1 show the specification of VOUT1 and VOUT2. ADS2, DSNU2, IL2, DR12, DR22, bit2 and line2 show the specification of VOUT3 to VOUT6. 2. Refer to TIMING CHART 2, 5. 3. When the fall time of 1L (t2') is the TYP. value (refer to TIMING CHART 2, 5).
DATA SHEET S13878EJ1V0DS00
5
PD3728
INPUT PIN CAPACITANCE (TA = +25 C, VOD = 12 V)
Parameter Shift register clock pin capacitance 1 Symbol Pin name Pin No. C1 MIN. TYP. 350 350 350 350 350 350 10 10 10 100 100 100 MAX. 500 500 500 500 500 500 Unit pF pF pF pF pF pF pF pF pF pF pF pF
1
13 23
10
Shift register clock pin capacitance 2 C2
9 14 24
2
20
Last stage shift register clock pin capacitance Reset gate clock pin capacitance Reset feed-through level clamp clock pin capacitance Transfer gate clock pin capacitance CL CRB CCLB CTG
28 29 8 30 22 21 15
1L RB CLB TG1 TG2 TG3
Remark Pins 13, 23 (1) and pin 9 (10) are connected each other inside of the device. Pins 14, 24 (2) and pin 28 (20) are connected each other inside of the device.
6
DATA SHEET S13878EJ1V0DS00
TIMING CHART 1 (Bit clamp mode, for each color)
TG1 to TG3
1 ( 10)
2 ( 20) 1L
7426 7428 7430 7432 7434
2 4 6 8 10 12 14
16 18 20
22
VOUT2, 4, 6
24 26
Optical black (96 pixels) Invalid photocell (6 pixels)
Valid photocell (7300 pixels) Invalid photocell (6 pixels)
7436 7438
120 122
124 126 128
130
132
28 30
DATA SHEET S13878EJ1V0DS00
RB
CLB
Note
7425 7427 7429 7431 7433 1 3 5 7 9 11 13 15 17 19 21 23 25 7435 7437 119 121 123 125 127 129 131 27 29
Note
VOUT1, 3, 5
PD3728
Note
Input the RB and CLB pulses continuously during this period, too.
7
PD3728
TIMING CHART 2 (Bit clamp mode, for each color)
t1 t2
1 ( 10)
10 %
90 %
2 ( 20)
90 % 10 % 90 % 10 % t1' 90 % 10 % t5 t3 t10 t8 90 % 10 % td t7 t9 t11 t6 t4 t2'
1L
RB
CLB
VOUT1 to VOUT6
RFTN
VOS 10 %
Symbol t1, t2 t1', t2' t3 t4 t5, t6 t7 t8, t9 t10 t11
MIN. 0 0 20 5 0 20 0 -10Note 1 -5Note 2
TYP. 50 5 50 200 20 150 20 +50 +50
MAX.
Unit ns ns ns
-
ns ns ns ns
-
ns ns
8
DATA SHEET S13878EJ1V0DS00
PD3728
Notes 1. MIN. of t10 shows that the RB and CLB overlap each other.
RB
90 %
t10
CLB
90 %
2. MIN. of t11 shows that the 1L and CLB overlap each other.
1L
90 %
CLB
t11
90 %
DATA SHEET S13878EJ1V0DS00
9
PD3728
TIMING CHART 3 (Bit clamp mode, for each color)
t13 90 % 10 % t15 t16 t12 t14
TG1 to TG3
1 ( 10) 2 ( 20)
90 %
1L RB CLB
Note 1
90 %
t11 90 %
Symbol t11 t12 t13, t14 t15, t16
MIN. -5Note 2 3000 0 900
TYP. +50 10000 50 1000
MAX.
Unit ns ns ns ns
Notes 1. Input the RB and CLB pulses continuously during this period, too. 2. MIN. of t11 shows that the 1L and CLB overlap each other.
1L
90 %
t11
CLB
90 %
1 (10), 2 (20) cross points
1L, 2 (20) cross points
1 ( 10)
2 ( 20)
2 V or more
2 ( 20)
2 V or more
1L
2 V or more
0.5 V or more
Remark
Adjust cross points (1 (10), 2 (20)) and (1L, 2 (20)) with input resistance of each pin.
10
DATA SHEET S13878EJ1V0DS00
TIMING CHART 4 (Line clamp mode, for each color)
TG1 to TG3
1 ( 10)
2 ( 20) 1L
VOUT2, 4, 6
Optical black (96 pixels)
Valid photocell (7300 pixels) Invalid photocell (6 pixels) Invalid photocell (6 pixels)
7426 7428 7430 7432 7434 7436 7438
120 122
124 126 128
130
132
2 4 6 8 10 12 14
16 18 20
22
24 26 28 30
DATA SHEET S13878EJ1V0DS00
RB
CLB
Note 7425 7427 7429 7431 7433 7435 7437 119 121 123 125 127 129 131 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 Note
VOUT1, 3, 5
PD3728
Note
Set the RB to high level during this period.
Remark Inverse pulse of the TG1 to TG3 can be used as CLB.
11
PD3728
TIMING CHART 5 (Line clamp mode, for each color)
t1
t2
1( 10)
10 %
90 %
2( 20)
90 % 10 % 90 % 10 % t1' 90 % t5 t3 t6 t4 t2'
1L
RB
10 % "H"
CLB
td VOUT1 to VOUT6
RFTN
VOS 10 %
Symbol t1, t2 t1', t2' t3 t4 t5, t6
MIN. 0 0 20 5 0
TYP. 50 5 50 200 20
MAX.
Unit ns ns ns
-
ns ns
12
DATA SHEET S13878EJ1V0DS00
PD3728
TIMING CHART 6 (Line clamp mode, for each color)
t13 90 % 10 % t15
t12
t14
TG1 to TG3
t16
1 ( 10) 2 ( 20)
90 %
1L RB CLB
90 % Note
t17 90 % 10 % t20
t18
t19
t21
Symbol t12 t13, t14 t15, t16 t17, t18 t19 t20, t21
MIN. 3000 0 900 100 200 0
TYP. 10000 50 1000 1000 t12 20
MAX.
Unit ns ns ns ns ns ns
Note
Set the RB to high level during this period.
Remark Inverse pulse of the TG1 to TG3 can be used as CLB.
1 (10), 2 (20) cross points
1 ( 10)
1L, 2 (20) cross points
2 ( 20)
2 V or more
2 V or more
2 V or more
0.5 V or more
2 ( 20)
1L
Remark Adjust cross points (1 (10), 2 (20)) and (1L, 2 (20)) with input resistance of each pin.
DATA SHEET S13878EJ1V0DS00
13
PD3728
DEFINITIONS OF CHARACTERISTIC ITEMS
1. Saturation voltage: Vsat Output signal voltage at which the response linearity is lost. 2. Saturation exposure: SE Product of intensity of illumination (IX) and storage time (s) when saturation of output voltage occurs. 3. Photo response non-uniformity: PRNU The output signal non-uniformity of all the valid pixels when the photosensitive surface is applied with the light of uniform illumination. This is calculated by the following formula.
PRNU (%) = x x 100 x x : maximum of xj - x
7300 j=1
xj
7300
x=
xj : Output voltage of valid pixel number j
VOUT
Register Dark DC level
x x
4.
Average dark signal: ADS Average output signal voltage of all the valid pixels at light shielding. This is calculated by the following formula.
7300 j=1
dj
7300 dj : Dark signal of valid pixel number j
ADS (mV) =
14
DATA SHEET S13878EJ1V0DS00
PD3728
5. Dark signal non-uniformity: DSNU Absolute maximum of the difference between ADS and voltage of the highest or lowest output pixel of all the valid pixels at light shielding. This is calculated by the following formula.
DSNU (mV) : maximum of dj - ADS j = 1 to 7300 dj : Dark signal of valid pixel number j
VOUT ADS Register Dark DC level DSNU
6.
Output impedance: ZO Impedance of the output pins viewed from outside.
7.
Response: R Output voltage divided by exposure (Ix*s). Note that the response varies with a light source (spectral characteristic).
8.
Image lag: IL The rate between the last output voltage and the next one after read out the data of a line.
TG
Light
ON
OFF
VOUT V1 VOUT
V1 IL (%) = VOUT
x100
DATA SHEET S13878EJ1V0DS00
15
PD3728
9. Register imbalance: RI The rate of the difference between the averages of the output voltage of Odd and Even pixels, against the average output voltage of all the valid pixels.
n
2 n RI (%) =
(V2j - 1 - V2j)
j= 1
2
1 n
Vj
j= 1
n
x 100
n : Number of valid pixels Vj : Output voltage of each pixel 10. Random noise: Random noise is defined as the standard deviation of a valid pixel output signal with 100 times (=100 lines) data sampling at dark (light shielding).
100
(mV) =
(Vi - V)
i=1
2
, V=
1
100
100
100 i=1
Vi
Vi: A valid pixel output signal among all of the valid pixels for each color
VOUT
V1 V2
line 1 line 2
V100
This is measured by the DC level sampling of only the signal level, not by CDS (Correlated Double Sampling).
...
line 100
...
16
DATA SHEET S13878EJ1V0DS00
PD3728
STANDARD CHARACTERISTIC CURVES (Nominal)
DARK OUTPUT TEMPERATURE CHARACTERISTIC 8 2
STORAGE TIME OUTPUT VOLTAGE CHARACTERISTIC (TA = +25 C)
4
Relative Output Voltage Relative Output Voltage
1
2
1
0.5
0.25
0.2
0.1 0
10
20
30
40
50
0.1
1
5 Storage Time (ms)
10
Operating Ambient Temperature TA(C)
TOTAL SPECTRAL RESPONSE CHARACTERISTICS (without infrared cut filter) (TA = +25 C) 100 B
80 R
Response Ratio (%)
60 G
40
20 G B 0 400 500 600 Wavelength (nm) 700 800
DATA SHEET S13878EJ1V0DS00
17
PD3728
APPLICATION CIRCUIT EXAMPLE
+5 V 10 + 10 F/16 V 0.1 F
B4
+12 V
PD3728
1 2
B6
+ 36 35 34 33 32 31 30 29 28 47 47 2
B2 B1 B3
VOUT4 GND VOUT6 GND VOUT5 GND VOD
VOUT3 GND VOUT1 GND VOUT2 GND
0.1 F 47 F/25 V
+5 V
3 4
+ 0.1 F 10 F/16 V
B5
5 6 7
RB
47 2
CLB 1L 20
CLB
8 9
RB 10
10 11 12 2 13 14 15 16 17 18
NC NC NC
NC NC NC
27 26 25 24 23 22 21 20 19 2 2 2 2
2
2 2
1 2 TG3
GND NC NC
2 1 TG1 TG2
NC NC
1 TG
Remarks 1. Pin 9 (10) and pin 28 (20) should be open to decrease the influence of input clock noise to output signal waveform, in case of operating at low or middle speed range; data rate under 24 MHz or so. 2. The inverters shown in the above application circuit example are the 74AC04.
18
DATA SHEET S13878EJ1V0DS00
PD3728
B1 to B6 EQUIVALENT CIRCUIT
+12 V 47 F/25 V +
0.1 F
4.7 k 110 CCD VOUT 47 2SA1005 1 k 2SC945
DATA SHEET S13878EJ1V0DS00
19
PD3728
PACKAGE DRAWING
CCD LINEAR IMAGE SENSOR 36-PIN CERAMIC DIP (600mil)
(Unit : mm)
94.000.50 9.50.9
1
(35.0) The 1st valid pixel
2
14.990.3
15.24 (4.33) 1.270.05 (2.33)
3
0.460.05 88.90.6
2.54 20.32 2.00.3
4
0.250.05 3.500.5 0.970.3 3.300.35
Name Glass cap 1 The 1st valid pixel 2 The 1st valid pixel 3 The surface of the chip 4 The bottom of the package
Dimensions 93.0 x 13.6 x 1.0
Refractive index 1.5
The center of the pin1 The center of the package (Reference) The top of the glass cap (Reference) The surface of the chip
36D-1CCD-PKG1-1
20
DATA SHEET S13878EJ1V0DS00
PD3728
NOTES ON THE USE OF THE PACKAGE
The application of an excessive load to the package may cause the package to warp or break, or cause chips to come off internally. Particular care should be taken when mounting the package on the circuit board. When mounting the package, use a circuit board which will not subject the package to bending stress, or use a socket. For this product, the reference value for the three-point bending strengthNote is 30 kg. Avoid imposing a load, however, on the inside portion as viewed from the face on which the window (glass) is bonded to the package body (ceramic). Note Three-point bending strength test Distance between supports: 70 mm, Support R: R 2 mm, Loading rate: 0.5 mm / min.
Load
Load
70 mm
70 mm
DATA SHEET S13878EJ1V0DS00
21
PD3728
[MEMO]
22
DATA SHEET S13878EJ1V0DS00
PD3728
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices. 3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function.
DATA SHEET S13878EJ1V0DS00
23
PD3728
[MEMO]
* The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. * No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. * NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. * Descriptions of circuits, software, and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software, and information in the design of the customer's equipment shall be done under the full responsibility of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third parties arising from the use of these circuits, software, and information. * While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. * NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance.
M7 98.8


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